| 摘要 |
PROBLEM TO BE SOLVED: To provide a three-dimensional measuring apparatus capable of further accurately three-dimensionally measuring a measurement target object and a control method therefor.SOLUTION: A three-dimensional measuring apparatus 100 comprises: a projection part 101 for projecting a pattern from at least one or a plurality of projection directions onto a measurement target object 104; and imaging units 102a-102e for obtaining at least one or a plurality of captured images by capturing images of the measurement target object from at least one or a plurality of view points. The three-dimensional measuring apparatus acquires an image position of the pattern projected onto the measurement target object from the captured image obtained by the imaging units, and, on the basis of the acquired image position of the pattern and an estimated image position of the pattern on the basis of a parameter set representing internal scattering of the measurement target object, calculates a three-dimensional coordinate of a surface of the measurement target object.SELECTED DRAWING: Figure 1 |
