发明名称 Aging-based leakage energy reduction method and system
摘要 A technique of reducing leakage energy associated with a post-silicon target circuit is generally described herein. One example method includes purposefully aging a plurality of gates in the target circuit based on a targeted metric including a timing constraint associated with the target circuit.
申请公布号 US9520292(B2) 申请公布日期 2016.12.13
申请号 US201314407072 申请日期 2013.01.06
申请人 EMPIRE TECHNOLOGY DEVELOPMENT LLC 发明人 Potkonjak Miodrag
分类号 G05F1/10;G05F3/02;H01L21/28;G06F17/50;H01L29/40 主分类号 G05F1/10
代理机构 Ren-Sheng International 代理人 Ren-Sheng International
主权项 1. A method to reduce leakage energy associated with a post-silicon target circuit, the method comprising: selecting a plurality of gates in the target circuit to be aged; determining an extent to which to age the selected plurality of gates; identifying a first set of gates and a second set of gates of the selected plurality of gates that will be aged differently based on a targeted metric including a timing constraint associated with the target circuit; based on the targeted metric, aging, to the determined extent, the first set of gates; and based on the targeted metric, aging, to less than the determined extent, the second set of gates.
地址 Wilmington DE US