发明名称 Cleaning apparatus for substrate
摘要 A cleaning apparatus capable of substantially complete removal of contaminations generated during the manufacturing process of glass substrates, semiconductor wafers, magnetic disk substrates, magnetic head substrates or the like. The cleaning apparatus comprises a cleaning bath which is greater in cross section than the material to be cleaned and which has an opening portion for insertion of the material to be cleaned, and an ultrasonic transducer attached to the cleaning bath. The apparatus precludes various defects arising from contaminations, and enhances reliability and yield of the substrates manufactured.
申请公布号 US5203798(A) 申请公布日期 1993.04.20
申请号 US19910720001 申请日期 1991.06.24
申请人 HITACHI, LTD. 发明人 WATANABE, MASAHIRO;OTAKE, MITSUYOSHI;HAMANO, MEGUMI
分类号 B08B3/12;G11B5/84;H01L21/00;H01L21/304 主分类号 B08B3/12
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