发明名称 Magnetic disk apparatus and optimum offset measuring method
摘要 A magnetic disk apparatus has a measuring pattern writing unit and an optimum offset measuring unit. The measuring pattern writing unit writes random patterns to adjacent tracks on both sides of a measuring track and, thereafter, writes a preamble pattern in which PR4 equalizing characteristics are normally obtained even if simple low pass filter characteristics have initially been set. The optimum offset measuring unit obtains a mean square error per sample obtained by dividing the sum SIGMA(y-W)2 of the squares of differences between sampling values y which were PR4 equalized and a predetermined ideal sampling value W in which there is no noise by the number of samples (N) while changing an offset amount, and determines an offset in which the mean square error is the minimum as an optimum offset.
申请公布号 US6476992(B1) 申请公布日期 2002.11.05
申请号 US19990452839 申请日期 1999.12.06
申请人 FUJITSU LIMITED 发明人 SHIMATANI KEIJI
分类号 G11B5/56;G11B5/012;G11B5/48;G11B5/58;G11B5/596;G11B20/10;G11B27/30;G11B27/36;(IPC1-7):G11B5/09 主分类号 G11B5/56
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