发明名称 Monolithically-integrated infrared sensor
摘要 <p>An integrated sensor (10) comprising a thermopile transducer (12) and signal processing circuitry (4) that are combined on a single semiconductor substrate (20), such that the transducer output signal is sampled in close vicinity by the processing circuitry (14). The sensor (10) comprises a frame (18) formed of a semiconductor material that is not heavily doped, and with which a diaphragm (16) is supported. The diaphragm (16) has a first surface for receiving thermal (e.g., infrared) radiation, and comprises multiple layers that include a sensing layer containing at least a pair of interlaced thermopiles (22). Each thermopile (22) comprises a sequence of thermocouples (24), each thermocouple (24) comprising dissimilar electrically-resistive materials that define hot junctions (26) located on the diaphragm (16) and cold junctions (28) located on the frame (18). The signal processing circuitry (14) is located on the frame (18) and electrically interconnected with the thermopiles (22). The thermopiles (22) are interlaced so that the output of one of the thermopiles (22) increases with increasing temperature difference between the hot and cold junctions (26,28) thereof, while the output of the second thermopile (22) decreases with increasing temperature difference between its hot and cold junctions (26,28). </p>
申请公布号 EP1333504(A3) 申请公布日期 2007.01.31
申请号 EP20030075163 申请日期 2003.01.17
申请人 DELPHI TECHNOLOGIES, INC. 发明人 CHAVAN, ABHIJEET V.;LOGSDON, JAMES H.;CHILCOTT, DAN W.;LEE, HAN-SHENG;LAMBERT, DAVID K.;VAS, TIMOTHY A.
分类号 G01K3/00;H01L35/02;G01J5/12;G01J5/14;G01K7/00;G01K7/02;H01L35/00;H01L35/08 主分类号 G01K3/00
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