发明名称 Method for testing the validity of initial-condition statements in circuit simulation, and correcting inconsistencies thereof
摘要 A method and a system for validating initial conditions (ICs) generally provided by a user when simulating a VLSI circuit are described. Inconsistent ICs sets are detected and replaced by consistent subsets thereof. The method selects the resistance and source values in a Norton or Thevenin circuit used to enforce the IC, and detects when specified ICs are inconsistent while preserving critical or fragile ICs when a two DC-pass approach is used. It further correlates the set of consistent ICs thus obtained with an equivalent circuit and simultaneously provides an input for future use. This allows a user to be notified and given a measure of how bad the inconsistencies are. Detecting inconsistencies is achieved either by measuring the holding current or by measuring the voltage drift if the two DC-pass approach is used.
申请公布号 US7441213(B2) 申请公布日期 2008.10.21
申请号 US20060307894 申请日期 2006.02.27
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 LEHNER TIMOTHY S.;KIMMEL RICHARD D.;SADIGH ALI;ACAR EMRAH;LIU YING;WEMPLE IVAN L.
分类号 G06F17/50 主分类号 G06F17/50
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