| 摘要 |
A test device comprises a base and a first fixture coupled to the base. The first fixture holds a first portion of an electronic device mounted in the test device. The test device includes a second fixture rotatably coupled to the base and a lever coupled to the second fixture. The second fixture holds a second portion of the electronic device mounted in the test device. The test device also includes an actuator that forcibly moves the lever to rotate the second fixture and apply a torsion stress on the electronic device mounted in the test device. The test device may be used to test the functionality of electronic devices, such as small form-factor disc drives, while under torsion stresses.
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