发明名称 Light emitting device
摘要 The disclosed light emitting device includes an intermediate layer interposed between the light emitting semiconductor structure and the substrate. The light emitting semiconductor structure includes a first conductivity-type semiconductor layer, a second conductivity-type semiconductor layer, and an active layer interposed between the first conductivity-type semiconductor layer and the second conductivity-type semiconductor layer, wherein the active layer has a multi quantum well structure including at least one period of a pair structure of a quantum barrier layer including AlxGa(1-x)N (0<x<1) and a quantum well layer including AlyGa(1-y)N (0<x<y<1), and at least one of the first conductivity-type semiconductor layer and the second conductivity-type semiconductor layer includes AlGaN. The intermediate layer includes AlN and has a plurality of air voids formed in the AlN. At least some of the air voids are irregularly aligned and the number of the air voids is 107 to 1010/cm2.
申请公布号 US9397257(B2) 申请公布日期 2016.07.19
申请号 US201514622361 申请日期 2015.02.13
申请人 LG INNOTEK CO., LTD. 发明人 Park Hae Jin;Kim Kyoung Hoon;Kim Dong Ha;Lee Kwang chil;Kim Jae Hun;Yun Hwan Hui
分类号 H01L33/32;H01L33/54;H01L33/06;H01L33/12;H01L21/02;H01L33/02;H01L33/62;H01L33/00;H01L33/20 主分类号 H01L33/32
代理机构 KED & Associaates, LLP 代理人 KED & Associaates, LLP
主权项 1. A light emitting device comprising: a substrate; a light emitting semiconductor structure disposed on the substrate; and an intermediate layer interposed between the light emitting semiconductor structure and the substrate, wherein: the light emitting semiconductor structure comprises a first conductivity-type semiconductor layer, a second conductivity-type semiconductor layer, and an active layer interposed between the first conductivity-type semiconductor layer and the second conductivity-type semiconductor layer, wherein the active layer has a multi quantum well structure comprising at least one period of a pair structure of a quantum barrier layer and a quantum well layer; the intermediate layer comprises AN and has a plurality of air voids formed in the AN, wherein at least some of the air voids are irregularly aligned; and the number of the air voids is 107/cm2 to 1010/cm2.
地址 Seoul KR