发明名称 Method for manufacturing semiconductor device
摘要 A method for manufacturing a semiconductor device includes: forming a photocatalytic layer and an organic compound layer in contact with the photocatalytic layer over a substrate having a light transmitting property; forming an element forming layer over the substrate having the light transmitting property with the photocatalytic layer and the organic compound layer in contact with the photocatalytic layer interposed therebetween; and separating the element forming layer from the substrate having the light transmitting property after the photocatalytic layer is irradiated with light through the substrate having the light transmitting property.
申请公布号 US9419142(B2) 申请公布日期 2016.08.16
申请号 US201213431073 申请日期 2012.03.27
申请人 Semiconductor Energy Laboratory Co., Ltd. 发明人 Morisue Masafumi;Jinbo Yasuhiro;Fujii Gen;Kimura Hajime
分类号 H01L29/786;G02F1/167;H01L27/12;H01L31/0392;H01L51/00;H01L27/32;H01L51/56 主分类号 H01L29/786
代理机构 Robinson Intellectual Property Law Office 代理人 Robinson Intellectual Property Law Office ;Robinson Eric J.
主权项 1. A semiconductor device comprising: a first flexible substrate; an organic compound layer in which inorganic compound particles are dispersed over and in contact with the first flexible substrate; an insulating layer over and in direct contact with the organic compound layer; an electrophoresis element over and in direct contact with the insulating layer; and a second flexible substrate over and in direct contact with the electrophoresis element, wherein the inorganic compound particles comprise one of silicon oxide, silicon nitride, aluminum oxide, tantalum oxide, and barium fluoride magnesium, wherein the insulating layer is a single layer selected from silicon nitride, silicon oxide, and aluminum nitride, and wherein the electrophoresis element includes a first conductive layer, a second conductive layer in direct contact with the second flexible substrate, and a microcapsule.
地址 Kanagawa-ken JP