| 摘要 |
PROBLEM TO BE SOLVED: To provide a device for quantitatively specifying a constituent element of a material existing in an object.SOLUTION: An internal material specification device 100 comprises: two muon track detection tools 10 which is disposed so as to sandwich an object, has surfaces facing each other extending on a plane, and can measure a muon incident position and a muon incident direction; and an analysis computer 20 which receives plural muon detection signals from the respective two muon track detection tools 10 and specifies an element forming an internal material. The analysis computer 20 comprises: a grouping part 21 which performs grouping of the plural muon detection signals for signals generated by the same muon; a muon diffusion angle calculation part 22 which calculates the muon diffusion angle based on the plural signals regarded to belong to the same group; a muon diffusion angle calibration part 23 which calibrates the muon diffusion angle and outputs a calibrated diffusion angle; and an internal material specification part 24 which specifies the element forming the internal material based on the calibrated diffusion angle.SELECTED DRAWING: Figure 1 |
