| 摘要 |
A purpose of the present invention is to provide a micro-lens enabling in a simple and highly accurate manner to assess an amount of misalignment with an optical axis generated by an error in a process of manufacturing a micro-lens. According to the present invention, the micro-lens manufactured using a semiconductor lens is provided with a lens portion, a peripheral portion located outside the lens portion and a mark for assessment formed near the peripheral portion during a process of manufacturing the lens portion.
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