发明名称 Process sheet resistance uniformity improvement using multiple melt laser exposures
摘要 Embodiments described herein relate to apparatus and methods of thermal processing. More specifically, apparatus and methods described herein relate to laser thermal treatment of semiconductor substrates by increasing the uniformity of energy distribution in an image at a surface of a substrate.
申请公布号 US9390926(B2) 申请公布日期 2016.07.12
申请号 US201414159228 申请日期 2014.01.20
申请人 APPLIED MATERIALS, INC. 发明人 Li Jiping;Hunter Aaron Muir;Adams Bruce E.;Vellore Kim;Howells Samuel C.;Moffatt Stephen
分类号 H01L21/00;H01L21/268;B23K26/00;B23K26/03;H01L21/20;H01L21/26;H01L21/36;H01L21/42;H01L21/44 主分类号 H01L21/00
代理机构 Patterson & Sheridan, LLP 代理人 Patterson & Sheridan, LLP
主权项 1. A method of thermally processing a substrate, comprising: positioning a substrate at a first position; identifying a treatment zone of the substrate; directing a first pulse of annealing energy through an aperture member at a second position to the treatment zone; moving the substrate to a third position different from the first position; moving the aperture member to a fourth position different from the second position, wherein the second position and the fourth position are located within a focal plane of the annealing energy; and directing a second pulse of annealing energy through the aperture member at the fourth position to the treatment zone.
地址 Santa Clara CA US