发明名称 |
Method for measuring the thickness of multi-layer films |
摘要 |
<p>Measuring the thickness of a multilayer film comprising layers of different nonconductive materials with a first sensor comprisesusing a second sensor that gives a different reading for the same thickness of the same material and supplying the signals from the two sensors to a computer, which determines the total thickness of the fils and/or the thickness of individual layers from the different readings.</p> |
申请公布号 |
EP1780498(A1) |
申请公布日期 |
2007.05.02 |
申请号 |
EP20050405613 |
申请日期 |
2005.10.28 |
申请人 |
HCH. KUENDIG & CIE. AG |
发明人 |
KELLER, ALBERT;HAENGGLI, MARKUS;WEBER, PHILIPP;STUKER, PETER |
分类号 |
G01B7/06;B29C47/92 |
主分类号 |
G01B7/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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