TEST APPARATUS, PIN ELECTRONIC CARD, ELECTRIC DEVICE AND SWITCH

摘要

A testing apparatus for testing a device to be tested is provided with a pin electronic section for transmitting and receiving signals to and from the device; a pattern generating section for inputting a test pattern to the device through a pin electronic section; and a judging section for receiving an output signal from the device through the pin electronic section and judging conformity of the device based on the output signal. The pin electronic section is provided with an internal circuit for transmitting and receiving the signals to and from the device; a first transmitting path for connecting the internal circuit with the device; and a first switch which connects the first transmission path to a grounding potential when the device is not being tested, and separates the first transmission path from the grounding potential when testing the device.