发明名称 Single stage charged particle beam energy width reduction system for charged particle beam system
摘要 The present invention provides a charged particle beam device. The device comprises a first lens generating a crossover a second lens positioned after the crossover and an element acting in a focusing and dispersive manner in an x-z-plane with a center of the element having essentially same z-position as the crossover. Further, a multipole element, which acts in the x-z-plane and a y-z-plane is provided. A first charged particle selection element and a second charged particle selection element are used for selecting a portion of the charged particles. Thereby, e.g. the energy width of the charged particle beam can be reduced.
申请公布号 US7468517(B2) 申请公布日期 2008.12.23
申请号 US20040571345 申请日期 2004.09.02
申请人 ICT INTEGRATED CIRCUIT TESTING GESELLSCHAFT FUR HALBLEITERNRUFTECHNIK MBH 发明人 FROSIEN JUERGEN;DEGENHARDT RALF;LANIO STEFAN;SCHOENECKER GERALD
分类号 G21K1/08;H01J37/05;H01J37/153;H01J37/20;H01J37/21;H01J37/28;H01J49/28;H01J49/46 主分类号 G21K1/08
代理机构 代理人
主权项
地址