发明名称 熱処理方法
摘要 PROBLEM TO BE SOLVED: To provide a thermal treatment apparatus and a thermal treatment method which radiate flash light to a substrate thereby uniformly heating the substrate.SOLUTION: A lower surface of a peripheral part of a semiconductor wafer W is supported by a support ring 71 placed on a cooling plate 72. The semiconductor wafer W is supported by the support ring 71 so that a surface where a resist film 11 is formed is located at a lower side. The support ring 71 is formed by a material such as a silicon carbide which is opaque for flush light. The flush light is radiated from a flush lamp FL to an upper surface (a rear surface) of the semiconductor wafer W supported by the support ring 71. Heat conduction occurs from the rear surface that a temperature is increased rapidly by flush light radiation to a front surface to heat the resist film 11. Further, the support ring 71 prevents the flush light from coming around the peripheral part on the surface of the semiconductor wafer W thereby enabling the semiconductor wafer W to be uniformly heated.
申请公布号 JP5951209(B2) 申请公布日期 2016.07.13
申请号 JP20110209146 申请日期 2011.09.26
申请人 株式会社SCREENホールディングス 发明人 横内 健一
分类号 H01L21/26;H01L21/027;H01L21/265 主分类号 H01L21/26
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