发明名称 METHOD FOR MANUFACTURING INSULATED GATE TYPE SWITCHING DEVICE, AND INSULATED GATE TYPE SWITCHING DEVICE
摘要 A method is provided for manufacturing an insulated gate type switching device. The method includes: implanting second conductivity type impurities into a surface of a semiconductor substrate so as to form a second region of a second conductivity type in the surface; forming a third region of the second conductivity type having a second conductivity type impurity density lower than the second region on the surface by epitaxial growth: and forming a trench gate electrode.
申请公布号 US2016351680(A1) 申请公布日期 2016.12.01
申请号 US201415114461 申请日期 2014.10.06
申请人 SOENO Akitaka;TAKEUCHI Yuichi;SOEJIMA Narumasa 发明人 SOENO Akitaka;TAKEUCHI Yuichi;SOEJIMA Narumasa
分类号 H01L29/66;H01L29/78;H01L29/423;H01L29/739;H01L29/10;H01L29/16 主分类号 H01L29/66
代理机构 代理人
主权项 1. A method of manufacturing an insulated gate type switching device, the method comprising: implanting second conductivity type impurities into a surface of a semiconductor substrate including a first region of a first conductivity type so as to form a second region of a second conductivity type in a range in the semiconductor substrate that is exposed on the surface; forming a third region of the second conductivity type on the surface by epitaxial growth after the formation of the second region, the third region having a second conductivity type impurity density lower than a second conductivity type impurity density in the second region; forming a fourth region of the first conductivity type being in contact with the third region and separated from the first region by the second and third regions; and forming a trench gate electrode facing the second and third regions via an insulating film.
地址 Toyota-shi JP