发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICES WITH COMBINED ARRAY AND PERIPHERY PATTERNING IN SELF-ALIGNED DOUBLE PATTERNING
摘要 Provided are improved semiconductor memory devices and methods for manufacturing such semiconductor memory devices. A method may incorporate the patterning of the array and periphery regions in self-aligned double patterning and provide semiconductor devices resulting from the combined patterning.
申请公布号 US2016365311(A1) 申请公布日期 2016.12.15
申请号 US201514735837 申请日期 2015.06.10
申请人 Macronix International Co.Ltd. 发明人 HUNG Yu-Min;HAN Tzung-Ting;HSU Miao-Chih
分类号 H01L23/528;H01L21/3213;H01L27/112;H01L21/768 主分类号 H01L23/528
代理机构 代理人
主权项 1. A semiconductor device comprising: a substrate; a first word line pad formed on the substrate; and a second word line pad formed on the substrate, wherein a space is located between the first word line pad and the second word line pad, the space comprising a substantially rectangular region having a first width represented by a and a substantially semicircular region having a second width represented by b integrated with the substantially rectangular region, and wherein the width b is from about 1.5 to about 3.0 times the width a, and a radius of the substantially semicircular region is from about 50 nm to about 500 nm.
地址 Hsin-chu TW