发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICES WITH COMBINED ARRAY AND PERIPHERY PATTERNING IN SELF-ALIGNED DOUBLE PATTERNING |
摘要 |
Provided are improved semiconductor memory devices and methods for manufacturing such semiconductor memory devices. A method may incorporate the patterning of the array and periphery regions in self-aligned double patterning and provide semiconductor devices resulting from the combined patterning. |
申请公布号 |
US2016365311(A1) |
申请公布日期 |
2016.12.15 |
申请号 |
US201514735837 |
申请日期 |
2015.06.10 |
申请人 |
Macronix International Co.Ltd. |
发明人 |
HUNG Yu-Min;HAN Tzung-Ting;HSU Miao-Chih |
分类号 |
H01L23/528;H01L21/3213;H01L27/112;H01L21/768 |
主分类号 |
H01L23/528 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
a substrate; a first word line pad formed on the substrate; and a second word line pad formed on the substrate, wherein a space is located between the first word line pad and the second word line pad, the space comprising a substantially rectangular region having a first width represented by a and a substantially semicircular region having a second width represented by b integrated with the substantially rectangular region, and wherein the width b is from about 1.5 to about 3.0 times the width a, and a radius of the substantially semicircular region is from about 50 nm to about 500 nm. |
地址 |
Hsin-chu TW |