Method and system for making optimal estimates of linearity metrics of analog-to-digital converters

摘要

A method and system for making optimal estimates of linearity metrics of analog-to-digital converters. A model building phase and a production test strategy are employed. During the model-building phase, a linear model an analog-to-digital converter is constructed from a set of accurately measured transition code voltages for a set of training analog-to-digital converters. During a production test of an individual analog-to-digital converter, a ramp test signal is applied to the individual analog-to-digital converter, a histogram of codes is produced, and the transition code voltages for the individual analog-to-digital converter are estimated from the resulting histogram. Linearity characteristics of the individual analog-to-digital converter may then be computed.