发明名称 Flash memory card test device with multiple interfaces
摘要 A flash memory card test device with multiple interfaces is disclosed. The flash memory card test device comprises at least one connection interface adaptor board and a test circuit board. The test circuit board is adapted for determining a specification of a flash memory to be tested and transmitting a test signal to test the flash memory.
申请公布号 US7480582(B2) 申请公布日期 2009.01.20
申请号 US20060613178 申请日期 2006.12.19
申请人 PHISON ELECTRONICS CORP. 发明人 CHEN BAN-HUI
分类号 G06F11/22;G06F11/273 主分类号 G06F11/22
代理机构 代理人
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