发明名称 Method and apparatus for beam control with optical MEMS beam waveguide
摘要 A high density, low power, high performance information system, method and apparatus are described in which perpendicularly oriented processor and memory die stacks (130, 140, 150, 160, 170) include integrated deflectable MEMS optical beam waveguides (e.g., 190) at each die edge (e.g., 151) to provide optical communications (184) in and between die stacks by using a beam control method and circuit to maintain and adjust alignment over time by calibrating and updating X and Y counter values stored in deflection registers (541-542) to control DAC circuitry (546, 548) which generates and supplies deflection voltages to charging capacitors (551, 552) connected to deflection electrodes (195-197) positioned on and around each MEMS optical beam waveguide (193-194) to provide two-dimensional alignment and controlled feedback to adjust beam alignment and establish optical communication links between die stacks.
申请公布号 US9442254(B2) 申请公布日期 2016.09.13
申请号 US201313914123 申请日期 2013.06.10
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 Pelley Perry H.
分类号 G02B6/12;G02B6/35;G02B6/122;H04B10/25;H04B10/80 主分类号 G02B6/12
代理机构 代理人
主权项 1. An apparatus comprising: beam control circuitry for controlling deflection of a first cantilevered MEMS optical beam waveguide, comprising: a plurality of separate deflection electrodes positioned to control deflection of the first cantilevered MEMS optical beam waveguide, the separate deflection electrodes comprising a vertical deflection electrode positioned above the first cantilevered MEMS optical beam waveguide and a plurality of separate lateral deflection electrodes positioned on at least a first side of the first cantilevered MEMS optical beam waveguide; and a bias circuit connected to provide separately controllable bias voltages to the plurality of separate deflection electrodes, thereby generating controlled, two-dimensional deflection of the first cantilevered MEMS optical beam waveguide.
地址 Austin TX US