发明名称 METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE AND RECORDING MEDIUM
摘要 A method of manufacturing a semiconductor device includes forming a seed layer containing a metal element on a substrate by performing a first process and a second process in a time-division manner. The first process supplying and exhausting organic metal-containing gas containing the metal element to the substrate. The second process supplying and exhausting inorganic metal-containing gas containing the metal element to the substrate, and forming a metal-containing nitride film on the substrate on which the seed layer is formed using the seed layer as a seed by performing a third process and a fourth process in a time-division manner. The third process supplying and exhausting the inorganic metal-containing gas to the substrate. The fourth process supplying and exhausting nitrogen-containing gas to the substrate.
申请公布号 US2016284552(A1) 申请公布日期 2016.09.29
申请号 US201615070387 申请日期 2016.03.15
申请人 HITACHI KOKUSAI ELECTRIC INC. 发明人 OGAWA Arito
分类号 H01L21/285;H01L27/108;H01L21/28 主分类号 H01L21/285
代理机构 代理人
主权项 1. A method of manufacturing a semiconductor device comprising: forming a seed layer containing a metal element on a substrate by performing a first process and a second process in a time-division manner a predetermined number of times, the first process supplying and exhausting organic metal-containing gas containing the metal element to the substrate, the second process supplying and exhausting inorganic metal-containing gas containing the metal element to the substrate; and forming a metal-containing nitride film on the substrate on which the seed layer is formed using the seed layer as a seed by performing a third process and a fourth process in a time-division manner a predetermined number of times, the third process supplying and exhausting the inorganic metal-containing gas to the substrate, the fourth process supplying and exhausting nitrogen-containing gas to the substrate.
地址 Tokyo JP