| 发明名称 |
Integrated circuit |
| 摘要 |
Integrated circuits and methods for testing integrated circuits are disclosed herein. An embodiment of an integrated circuit includes a microprocessor and memory that is accessible by the microprocessor. The integrated circuit also includes reconfigurable logic, wherein a first test program for testing at least one of the microprocessor and memory is loadable onto the reconfigurable logic. At least one other program is loadable into the reconfigurable logic after the first test program runs. |
| 申请公布号 |
US9482718(B2) |
申请公布日期 |
2016.11.01 |
| 申请号 |
US201414153280 |
申请日期 |
2014.01.13 |
| 申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
Bittlestone Clive David |
| 分类号 |
G01R31/28;G01R31/317;G06F11/22 |
主分类号 |
G01R31/28 |
| 代理机构 |
|
代理人 |
Pessetto John R.;Brill Charles A.;Cimino Frank D. |
| 主权项 |
1. An integrated circuit comprising:
a microprocessor; memory that is accessible by the microprocessor; and reconfigurable logic, wherein the reconfigurable logic is operable to be reconfigured by loading a new logic circuit onto a fabric of the reconfigurable logic, wherein the reconfigurable logic is operable to be reconfigured by a first test program for testing at least one of the microprocessor and memory, and wherein the reconfigurable logic is operable to be reconfigured by at least one other program after the first test program runs. |
| 地址 |
Dallas TX US |
