发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
A through electrode and a multilayer wiring are provided on a semiconductor substrate, and a bottom layer connection wiring, a lower layer connection wiring, an upper layer connection wiring, and a top layer connection wiring are provided in the multilayer wiring. The through electrode is connected to the bottom layer connection wiring, and a via is arranged at a position other than a position immediately above the through electrode. |
申请公布号 |
US2016351492(A1) |
申请公布日期 |
2016.12.01 |
申请号 |
US201615055159 |
申请日期 |
2016.02.26 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
WATANABE Shinya;NAMBU Toshihiro |
分类号 |
H01L23/528;H01L23/532;H01L29/49;G01R31/28;H01L21/768;H01L25/065;H01L23/00;H01L23/48;H01L23/522 |
主分类号 |
H01L23/528 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
an insulating layer located on a semiconductor layer; a multilayer wiring, including a bottom layer wiring, located on the insulating layer; a gate electrode located above the semiconductor layer; and a through electrode extending through the semiconductor layer and in direct contact with the bottom layer wiring of the multilayer wiring, wherein the bottom layer wiring and the gate electrode comprise the same material. |
地址 |
Tokyo JP |