发明名称 |
Process for preparing thin semiconductor films |
摘要 |
<p>A semiconductor thin film prodn. process involves (a) ion implantation (12) across a semiconductor wafer face (14), which is parallel to a crystallographic plane of the semiconductor, in order to form a cleavage layer (16) of gaseous micro-bubbles which delimits a surface layer (18) in the wafer (10); and (b) wafer heat treatment to cause separation of the surface layer (18) from the rest of the wafer along the micro-bubble layer by the effects of crystalline rearrangement and pressure in the micro-bubbles. The novelty is that the implantation energy is such that the ion penetration depth is greater than a minimum depth required to obtain a thin film of the surface layer which is sufficiently rigid for release by the heat treatment. Pref. the wafer is of silicon or silicon carbide and the minimum depth is 5 microns or 1.15 microns respectively.</p> |
申请公布号 |
EP0763849(A1) |
申请公布日期 |
1997.03.19 |
申请号 |
EP19960401932 |
申请日期 |
1996.09.10 |
申请人 |
COMMISSARIAT A L'ENERGIE ATOMIQUE |
发明人 |
BRUEL, MICHEL |
分类号 |
C30B31/22;H01L21/02;H01L21/265;H01L21/762;H01L27/12;(IPC1-7):H01L21/20 |
主分类号 |
C30B31/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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