发明名称 Process for preparing thin semiconductor films
摘要 <p>A semiconductor thin film prodn. process involves (a) ion implantation (12) across a semiconductor wafer face (14), which is parallel to a crystallographic plane of the semiconductor, in order to form a cleavage layer (16) of gaseous micro-bubbles which delimits a surface layer (18) in the wafer (10); and (b) wafer heat treatment to cause separation of the surface layer (18) from the rest of the wafer along the micro-bubble layer by the effects of crystalline rearrangement and pressure in the micro-bubbles. The novelty is that the implantation energy is such that the ion penetration depth is greater than a minimum depth required to obtain a thin film of the surface layer which is sufficiently rigid for release by the heat treatment. Pref. the wafer is of silicon or silicon carbide and the minimum depth is 5 microns or 1.15 microns respectively.</p>
申请公布号 EP0763849(A1) 申请公布日期 1997.03.19
申请号 EP19960401932 申请日期 1996.09.10
申请人 COMMISSARIAT A L'ENERGIE ATOMIQUE 发明人 BRUEL, MICHEL
分类号 C30B31/22;H01L21/02;H01L21/265;H01L21/762;H01L27/12;(IPC1-7):H01L21/20 主分类号 C30B31/22
代理机构 代理人
主权项
地址
您可能感兴趣的专利