发明名称 SPIN TRANSISTOR, AND SEMICONDUCTOR MEMORY
摘要 PROBLEM TO BE SOLVED: To provide a spin transistor with a sufficient magnetoresistance change rate of a source electrode and drain electrode, and provide a semiconductor memory using such the spin transistor. SOLUTION: The spin transistor 1 comprises a source electrode layer S formed of ferromagnetic material, a drain electrode layer D formed of ferromagnetic material, a semiconductor SUB having the source electrode layer S and the drain electrode layer D and schottky-contacting with the source electrode layer S, a gate electrode layer GE provided on the semiconductor SUB directly or through a gate insulating layer GI, and a spin filter layer F provided on the semiconductor SUB through the source electrode layer S for injecting electrons em which is spin-polarized in a same direction as a magnetization direction SM of the ferromagnetic material, which forms the source electrode layer S. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009059820(A) 申请公布日期 2009.03.19
申请号 JP20070224630 申请日期 2007.08.30
申请人 TDK CORP 发明人 TAGAMI MASAMICHI;OIKAWA TORU
分类号 H01L29/82;H01L21/8246;H01L27/105;H01L29/78;H01L43/08 主分类号 H01L29/82
代理机构 代理人
主权项
地址