发明名称 MAGNETIC MEMORY DEVICES
摘要 Magnetic memory devices are provided. A magnetic memory device includes a Magnetic Tunnel Junction (MTJ) structure on a contact. Moreover, the magnetic memory device includes an insulating structure and an electrode between the MTJ structure and the contact. In some embodiments, a first contact area of the electrode with the MTJ structure is smaller than a second contact area of the insulating structure with the MTJ structure.
申请公布号 US2016218145(A1) 申请公布日期 2016.07.28
申请号 US201514964251 申请日期 2015.12.09
申请人 Han Shinhee;Lee Kilho;Song Yoonjong 发明人 Han Shinhee;Lee Kilho;Song Yoonjong
分类号 H01L27/22;G11C11/16;H01L43/02 主分类号 H01L27/22
代理机构 代理人
主权项 1. A magnetic memory device, comprising: a lower insulating layer on a substrate; an insulating structure on the lower insulating layer; a lower contact in the lower insulating layer; a lower electrode in the insulating structure and electrically connected to the lower contact; and a magnetic tunnel junction pattern in contact with at least a portion of a top surface of the insulating structure and at least a portion of a top surface of the lower electrode, wherein the lower electrode comprises a bottom portion and a protruding portion protruding from a top surface of the bottom portion toward the magnetic tunnel junction pattern, wherein at least a portion of the top surface of the bottom portion of the lower electrode is in contact with the insulating structure, and wherein a root-mean-square roughness of the top surfaces of the insulating structure and the lower electrode that are in contact with the magnetic tunnel junction pattern ranges from 0.01 nanometers (nm) to 1 nm.
地址 Seongnam-si KR