发明名称 |
MAGNETIC MEMORY DEVICES |
摘要 |
Magnetic memory devices are provided. A magnetic memory device includes a Magnetic Tunnel Junction (MTJ) structure on a contact. Moreover, the magnetic memory device includes an insulating structure and an electrode between the MTJ structure and the contact. In some embodiments, a first contact area of the electrode with the MTJ structure is smaller than a second contact area of the insulating structure with the MTJ structure. |
申请公布号 |
US2016218145(A1) |
申请公布日期 |
2016.07.28 |
申请号 |
US201514964251 |
申请日期 |
2015.12.09 |
申请人 |
Han Shinhee;Lee Kilho;Song Yoonjong |
发明人 |
Han Shinhee;Lee Kilho;Song Yoonjong |
分类号 |
H01L27/22;G11C11/16;H01L43/02 |
主分类号 |
H01L27/22 |
代理机构 |
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代理人 |
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主权项 |
1. A magnetic memory device, comprising:
a lower insulating layer on a substrate; an insulating structure on the lower insulating layer; a lower contact in the lower insulating layer; a lower electrode in the insulating structure and electrically connected to the lower contact; and a magnetic tunnel junction pattern in contact with at least a portion of a top surface of the insulating structure and at least a portion of a top surface of the lower electrode, wherein the lower electrode comprises a bottom portion and a protruding portion protruding from a top surface of the bottom portion toward the magnetic tunnel junction pattern, wherein at least a portion of the top surface of the bottom portion of the lower electrode is in contact with the insulating structure, and wherein a root-mean-square roughness of the top surfaces of the insulating structure and the lower electrode that are in contact with the magnetic tunnel junction pattern ranges from 0.01 nanometers (nm) to 1 nm. |
地址 |
Seongnam-si KR |