发明名称 Growth of a semiconductor layer structure
摘要 A method of growing a semiconductor layer structure comprises growing a first semiconductor layer and incorporating hydrogen into the first semiconductor layer. One or more further semiconductor layers are then grown over the first semiconductor layer to form a semiconductor layer structure. A selected portion of the first semiconductor layer is then annealed so as to change the electrical resistance of the selected portion of the first semiconductor layer. The electrical resistance of the one or more further semiconductor layers that have been grown over the first semiconductor layer is not significantly changed by the annealing step. The invention may be used, for example, to create a current aperture in a semiconductor layer within a semiconductor layer structure.
申请公布号 US7504322(B2) 申请公布日期 2009.03.17
申请号 US20060558972 申请日期 2006.11.13
申请人 SHARP KABUSHIKI KAISHA 发明人 KAUER MATTHIAS
分类号 H01L21/84;H01L33/00;H01L33/10;H01L33/14;H01L33/30;H01L33/46 主分类号 H01L21/84
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