发明名称 SYSTEMS OR METHOD FOR TRACKING DIE USE OR YIELD.
摘要 <p>A company cutting leather pieces for assembly into a desired number of products, such as automobile interior components, wishes to cut the number of pieces of each or several patterns that are required to create the desired number of final products. The company may also, or alternately, wish to determine the yield of cut products from a particular hide. An RFID (Radio Frequency Identification) tag containing information related to a pattern identity associated with each die may be placed onto each die. Dies placed on a hide for cutting may be polled to update a count of each pattern cut or to be cut. A hide may be scanned and fitted with an RFID tag containing information related to the area of the hide. Dies may be placed on the hide and the hide and dies polled to enable a comparison of the area of the hide with the total area of the patterns associated with the dies.</p>
申请公布号 MX2009002312(A) 申请公布日期 2009.03.13
申请号 MX20090002312 申请日期 2007.08.28
申请人 ONTARIO DIE INTERNATIONAL INC. 发明人 GARY S. LEVENE
分类号 B26D7/27;B26D5/00 主分类号 B26D7/27
代理机构 代理人
主权项
地址
您可能感兴趣的专利