Systems and methods related to near-field electromagnetic scanners

摘要

Disclosed are systems, devices and methods related to scanners that are utilized for multiple electrical and/or magnetic field measurements at different locations of a radio-frequency (RF) module. In some embodiments, a scanning system can includes a miniature probe such as a magnetic probe, a fixture system configured to hold a device under test (DUT) such as an RF module, an operating system configured to operate the DUT, and a measurement system configured to obtain field strength measurements through the miniature probe at different locations of the DUT. Such measurements can yield a near-field distribution over a plurality of selected areas of the DUT, with each of the selected areas being smaller than an overall lateral area of the DUT. In some implementations, such a scanning system is utilized to facilitate applications such as electromagnetic (EM) shielding designs.

主权项

1. A system for scanning for electromagnetic (EM) emission, the system comprising:
a fixture system configured to hold a device under test (DUT) and provide electrical connections for the DUT; an operating system connected to the fixture system and configured to allow operation of the DUT; and a measurement system configured to obtain field strength measurements representative of a field distribution over a plurality of selected areas of the DUT during the operation of the DUT, each of the selected areas being smaller than an overall lateral area of the DUT, the measurement system including a magnetic field probe, the magnetic field probe including a loop, the loop including a first end connected to a distal end of an inner conductor and a second end connected to a distal end of an outer conductive shield, the inner conductor and the outer conductive shield arranged in a coaxial configuration, the loop configured so that a change in magnetic field flux through the loop induces a detectable common mode current.