| 摘要 |
<p>A tray transferring apparatus for a test handler and a tray transferring method using the same are provided to improve the efficiency of the test about the semiconductor devices by reducing the interference of the arms. A tray transferring apparatus for the test handler comprises a loading part(110), the first loading arm(140), the second loading arm(150), the first unloading arm(240), the second unloading arm(250), and an unloading part(230). The loading part has a customer tray(CT). The tray has the semiconductor device of the test object. The first loading arm delivers the tray to the test loading area(TLA). The tray delivers the semiconductor device to the tester. The second loading arm collects the tray from the test loading area. The first unloading arm delivers the tray to the test unloading area(TUA). The second unloading arm collects the tray from the test unloading area.</p> |
