Polarization characteristic measuring method and apparatus

摘要

PCT No. PCT/JP97/03391 Sec. 371 Date May 1, 1998 Sec. 102(e) Date May 1, 1998 PCT Filed Sep. 24, 1997 PCT Pub. No. WO98/13676 PCT Pub. Date Apr. 2, 1998Provided is a polarization characteristic measuring method and apparatus for accurately measuring a polarization characteristic of fluorescence or Raman-scattered light emitted when a sample is exposed to light. The sample is exposed to excitation light radiated from a pulsed excitation light source and converted to p-polarized light by polarizer and half-wave plate, and photodetectors measure an intensity Ipp of a p-polarized component and an intensity Ips of an s-polarized component of fluorescence emitted from the sample under irradiation with the excitation light. In similar fashion, the sample is exposed to the excitation light of s-polarized light and the detectors measure an intensity Isp of a p-polarized component and an intensity Iss of an s-polarized component of fluorescence emitted from the sample under irradiation. From these measured values, G factor is calculated according to the following equation: G=[(IppxIsp)/(IpsxIss)]+E,fra 1/2+EE and polarization response correction is effected based on this G factor to obtain the polarization characteristic of fluorescence.