Method for electronic component testing

摘要

The test method includes the sending of a first signal (S1), having specified nonmonotonic time-dependence and a duration (T1), to a component cell, the measurement of resulting output signal (S2), represented by a pattern of electrical states of the cell, and accepting the component if the pattern of states conforms to an expected pattern. If the component is acceptable, the test is repeated with a second signal (S1') similar to the first signal but having a shorter duration (T2), and the output signal (S2') is compared to a compressed pattern. If the more rapid test is also valid, a still shorter input signal can be used on the components to be tested. A clock is used to determine the period of succession of elements of the first pattern, and the clock period can be decreased. A table is used for the first pattern sampling, and the duration of signal having the pattern given by the tabulated samples corresponds to a compressed pattern. A set of tables is used for the first pattern sampling and the tables represent possible patterns for obtaining the compressed patterns with different compression rates. A test comprises several patterns for testing the component cell, and includes different compression rates for different patterns of the first signal. Several circuits of the same electronic components are tested simultaneously. Different compression rates are defined for the compression of patterns of the first signal sent simultaneously to each circuit to be tested. The electronic component is qualified by a function of compression rates used to compress the duration of first signal patterns. The first signal having the compressed pattern defined by a circuit or a component precedingly tested is sent to a following circuit or a following component. The component is aged by subjecting it to repeated temperature variations, and tested by sending the first signal and measuring the resulting output signal. The first signal is a programming signal of a memory cell in the integrated circuit of electronic component, in particular of type Flash-EPROM, and the memory cell is erased at the end of test.