发明名称 Semiconductor integrated circuit and system guaranteeing proper operation under low-temperature condition
摘要 A semiconductor integrated circuit includes a measurement circuit configured to detect a measuring quantity dependent on temperature, and a heating circuit configured to generate heat in response to a detection, by the measurement circuit, of the measuring quantity indicating that the temperature is lower than a predetermined level.
申请公布号 US2007216376(A1) 申请公布日期 2007.09.20
申请号 US20060505439 申请日期 2006.08.17
申请人 FUJITSU LIMITED 发明人 OGAWA TOSHIO
分类号 G05F1/10 主分类号 G05F1/10
代理机构 代理人
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