| 摘要 |
One object of the present invention is to provide an LSI that can dynamically perform appropriate adjustment for a power voltage to be supplied to an internal circuit, not only at the time of the occurrence of the initial change of a performance due to a variation or variety factors through a manufacturing process, but also at the time of the occurrence of the time elapsed change. An LSI 13 includes a semiconductor substrate 14 , a ring oscillator 17 formed on the semiconductor substrate 14 and for outputting a monitoring clock signal MCLK having a frequency that depends on a manufacturing process, an internal circuit 16 formed on the semiconductor substrate 14 ; a frequency comparison circuit 18 for comparing the monitoring the clock signal MCLK with a reference clock signal RCLK having a predetermined frequency, and for outputting a differential signal DIF corresponding to the difference between the frequencies; and an internal power supply circuit 19 for supplying an internal power voltage IVDD to the internal circuit 16 , corresponding to the differential signal DIF that is outputted by the frequency comparison circuit 18 . Further provided is a design structure embodied in a machine readable medium used in a design process, where the design structure includes such LSI.
|
