发明名称 |
Process for producing a group-III nitride crystal and process for producing a light-emitting semiconductor element or a semiconductor device comprising a group-III nitride crystal |
摘要 |
Provided is a base substrate with which a Group-III nitride crystal having a large area and a large thickness can be grown while inhibiting crack generation. A single-crystal substrate for use in growing a Group-III nitride crystal thereon, which satisfies the following Z1>0 expression (1), wherein Z1 (μm) is an amount of warpage of physical shape in a growth surface of the single-crystal substrate and Z2<0 expression (2), wherein Z2 (μm) is an amount of warpage calculated from a radius of curvature of crystallographic-plane shape in a growth surface of the single-crystal substrate. |
申请公布号 |
US9428386(B2) |
申请公布日期 |
2016.08.30 |
申请号 |
US201414229316 |
申请日期 |
2014.03.28 |
申请人 |
MITSUBISHI CHEMICAL CORPORATION |
发明人 |
Fujito Kenji;Uchiyama Yasuhiro |
分类号 |
C30B25/18;C01B21/06;C30B29/40;H01L21/02;C30B7/10;C30B9/12 |
主分类号 |
C30B25/18 |
代理机构 |
Oblon, McClelland, Maier & Neustadt, L.L.P. |
代理人 |
Oblon, McClelland, Maier & Neustadt, L.L.P. |
主权项 |
1. A method for producing a light-emitting semiconductor element or a semiconductor device, which comprises growing a Group-III nitride crystal on a growth surface of a single-crystal substrate, wherein the single-crystal substrate satisfies the following expressions (1) and (2) and has a back surface of concave shape, wherein Z1 (μm) is an amount of warpage of physical shape in a growth surface of the single-crystal substrate and Z2 (μm) is an amount of warpage calculated from a radius of curvature of crystallographic-plane shape in a growth surface of the single crystal substrate:
Z1>0 Expression (1) Z2<0 Expression (2). |
地址 |
Tokyo JP |