发明名称 Semiconductor integrated circuit
摘要 A low side control circuit and a high side control circuit are disposed in first and second n type well regions, respectively. A third n− type well region is formed around the second n type well region. The first n− type well region is formed outside the second n− type well region. A p type well region is formed around the third n− type well region. The third n− type well region and the p type well region constitute an HVJT between the first and second n type well regions. A p+ type contact region and a first electrode supplied with GND potential are formed in the p type well region. In the p type well region, an n+ type contact region and a second electrode supplied with L-VDD potential higher than the GND potential are formed between the HVJT and the p+ type contact region.
申请公布号 US9478543(B2) 申请公布日期 2016.10.25
申请号 US201514692171 申请日期 2015.04.21
申请人 FUJI ELECTRIC CO., LTD. 发明人 Yamaji Masaharu
分类号 H01L27/092;H01L21/761;H01L21/8238 主分类号 H01L27/092
代理机构 Rabin & Berdo, P.C. 代理人 Rabin & Berdo, P.C.
主权项 1. A semiconductor integrated circuit comprising: a first-conductivity-type semiconductor substrate; a first second-conductivity-type well region formed in one main surface side of the first-conductivity-type semiconductor substrate; a second second-conductivity-type well region formed in the one main surface side of the substrate and separately from the first second-conductivity-type well region; a first circuit formed in the first second-conductivity-type well region and supplied with a second potential higher than a first potential, the second potential being supplied from a first low voltage power supply using the first potential as a reference; a second circuit formed in the second second-conductivity-type well region and supplied with a fourth potential higher than a third potential, the fourth potential being supplied from a second low voltage power supply using the third potential as a reference; a first-conductivity-type well region formed adjacent to and around the second second-conductivity-type well region and adjacent to the substrate; a first-conductivity-type semiconductor region selectively formed in the first-conductivity-type well region; a first electrode supplied with the first potential and connected to the first-conductivity-type semiconductor region; a second-conductivity-type semiconductor region selectively formed in the first-conductivity-type well region and separately from the first-conductivity-type semiconductor region, nearer to the second second-conductivity-type well region than to the first-conductivity-type semiconductor region; and a second electrode supplied with the second potential and connected to the second-conductivity-type semiconductor region.
地址 Kawasaki-Shi JP