发明名称 |
Method of semiconductor integrated circuit fabrication |
摘要 |
A method of fabricating a semiconductor integrated circuit (IC) is disclosed. The method includes providing a substrate. A first dielectric layer is deposited on the substrate. A patterned photoresist layer is formed on the first dielectric layer. The patterned photoresist layer is trimmed. The first dielectric layer is etched through the trimmed patterned photoresist layer to form a dielectric feature. A sacrificing energy decomposable layer (SEDL) is deposited on the dielectric feature and etched to form a SEDL spacer on sides of the dielectric feature. A second dielectric layer is deposited on the SEDL spacer and etched to form a dielectric spacer. The SEDL spacer is decomposed to form a trench. |
申请公布号 |
US9478430(B2) |
申请公布日期 |
2016.10.25 |
申请号 |
US201414532462 |
申请日期 |
2014.11.04 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
发明人 |
Yao Hsin-Chieh;Tsai Cheng-Hsiung;Lee Chung-Ju;Bao Tien-I |
分类号 |
H01L21/02;H01L23/48;H01L21/308;H01L21/768 |
主分类号 |
H01L21/02 |
代理机构 |
Haynes and Boone, LLP |
代理人 |
Haynes and Boone, LLP |
主权项 |
1. A method for fabricating a semiconductor integrated circuit (IC), the method comprising:
depositing a first dielectric layer on a substrate; forming a patterned photoresist layer on the first dielectric layer to have opaque regions and openings; trimming the opaque regions; etching the first dielectric layer through the patterned photoresist layer to form a dielectric feature; forming sacrificing-energy-decomposable-layer (SEDL) spacers along sidewalls of the dielectric feature; forming dielectric spacers along sidewalls of the SEDL spacers; and decomposing the SEDL spacers to form trenches over the substrate. |
地址 |
Hsin-Chu TW |