发明名称 |
SEMICONDUCTOR DEVICE WITH A PASSIVATED JUNCTION |
摘要 |
<p>In a semiconductor device the perimeter of a base-emitter junction (Jf) at a surface is protected by a film of silicon nitride (11), preferably formed by a direct nitridation process. A base contact electrode (8) is made of highly doped polysilicon, the surface of which is thermally oxidised to form a silicon dioxide layer (9) which terminates on the silicon nitride film (11) and which separates the base contact electrode (8) from an emitter contact electrode (10). Such a device can be fabricated in a self-alignment fashion using only one lithographic mask to form base and emitter regions and corresponding contacts.</p> |
申请公布号 |
EP0109766(B1) |
申请公布日期 |
1986.12.30 |
申请号 |
EP19830306396 |
申请日期 |
1983.10.21 |
申请人 |
FUJITSU LIMITED |
发明人 |
GOTO, HIROSHI C/O FUJITSU LIMITED |
分类号 |
H01L29/73;H01L21/316;H01L21/318;H01L21/331;H01L23/532;H01L29/423;H01L29/72;(IPC1-7):H01L23/28 |
主分类号 |
H01L29/73 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|