发明名称 SEMICONDUCTOR DEVICE WITH A PASSIVATED JUNCTION
摘要 <p>In a semiconductor device the perimeter of a base-emitter junction (Jf) at a surface is protected by a film of silicon nitride (11), preferably formed by a direct nitridation process. A base contact electrode (8) is made of highly doped polysilicon, the surface of which is thermally oxidised to form a silicon dioxide layer (9) which terminates on the silicon nitride film (11) and which separates the base contact electrode (8) from an emitter contact electrode (10). Such a device can be fabricated in a self-alignment fashion using only one lithographic mask to form base and emitter regions and corresponding contacts.</p>
申请公布号 EP0109766(B1) 申请公布日期 1986.12.30
申请号 EP19830306396 申请日期 1983.10.21
申请人 FUJITSU LIMITED 发明人 GOTO, HIROSHI C/O FUJITSU LIMITED
分类号 H01L29/73;H01L21/316;H01L21/318;H01L21/331;H01L23/532;H01L29/423;H01L29/72;(IPC1-7):H01L23/28 主分类号 H01L29/73
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