| 摘要 |
<p>Provided is a test apparatus that tests a device under test, comprising a test signal generating section that generates a test signal to be applied to the device under test; a first driver that is electrically connected to a terminal of the device under test and that supplies the test signal to the terminal of the device under test; a correction signal generating section that generates a correction signal for correcting attenuation of the test signal occurring until the test signal reaches the terminal of the device under test; and a second driver that is electrically connected to the terminal of the device under test and that supplies the correction signal to the terminal of the device under test.</p> |
