发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device capable of suppressing dispersion in a data erasing characteristic due to a voltage drop of wire resistor. SOLUTION: Each of memory cells 5 includes: a trench 6 formed on an element forming substrate 1; an oxide film 7 formed on the sidewall of the trench 6; a tunnel oxide film 8 formed on the bottom of the trench 6; a floating gate 9 formed in the trench 6 via the oxide film 7 and the tunnel oxide film 8 to write data or read out data; and a back electrode 2 formed on the tunnel oxide film 8 on the opposite side of the floating gate 9 to erase data written in the floating gate 9. When voltage is applied to the back electrode 2 in data erasing, the data stored in respective memory cells 5 can be collectively erased. COPYRIGHT: (C)2009,JPO&INPIT
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申请公布号 |
JP2009135445(A) |
申请公布日期 |
2009.06.18 |
申请号 |
JP20080264848 |
申请日期 |
2008.10.14 |
申请人 |
DENSO CORP |
发明人 |
NARUSE TAKAYOSHI;KATADA MITSUTAKA;FUJII TETSUO |
分类号 |
H01L21/8247;H01L27/115;H01L29/788;H01L29/792 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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