发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device capable of suppressing dispersion in a data erasing characteristic due to a voltage drop of wire resistor. SOLUTION: Each of memory cells 5 includes: a trench 6 formed on an element forming substrate 1; an oxide film 7 formed on the sidewall of the trench 6; a tunnel oxide film 8 formed on the bottom of the trench 6; a floating gate 9 formed in the trench 6 via the oxide film 7 and the tunnel oxide film 8 to write data or read out data; and a back electrode 2 formed on the tunnel oxide film 8 on the opposite side of the floating gate 9 to erase data written in the floating gate 9. When voltage is applied to the back electrode 2 in data erasing, the data stored in respective memory cells 5 can be collectively erased. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009135445(A) 申请公布日期 2009.06.18
申请号 JP20080264848 申请日期 2008.10.14
申请人 DENSO CORP 发明人 NARUSE TAKAYOSHI;KATADA MITSUTAKA;FUJII TETSUO
分类号 H01L21/8247;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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