发明名称 Correlated double-sampling circuit and cyclic analog-to-digital converter including the same
摘要 An analog-to-digital converter (ADC) includes first and second circuits, a differential amplifier, a comparator and a digital-to-analog converter (DAC). The first circuit samples a reset voltage, amplifies the sampled reset voltage, and subtracts a first reference voltage from the amplified reset voltage to produce a first difference. The second circuit samples a signal voltage, amplifies the sampled signal voltage, and subtracts a second reference voltage from the amplified signal voltage to produce a second difference. The differential amplifier produces a third difference based a comparison of the first and second differences from the first and second circuits. The comparator compares an output of the differential amplifier with at least one predetermined comparison voltage and outputs a comparison result as a digital value. The DAC is connected to the first and second circuits and the comparator, and controls the first and second reference voltages in response to the digital value.
申请公布号 US7535398(B2) 申请公布日期 2009.05.19
申请号 US20070872850 申请日期 2007.10.16
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LIM SEUNG-HYUN;LEE JEONG-HWAN;HAN GUN-HEE;HAM SEOG-HOON
分类号 H03M1/12 主分类号 H03M1/12
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