发明名称 |
SAMPLE TESTING SYSTEMS AND METHODS WITH AUTOMATED CLEANING |
摘要 |
A sample testing system includes a test receptacle support structure, an optical element positioned for transmitting electromagnetic radiation emitted or reflected by a sample disposed in a test receptacle supported by the test receptacle support structure, a cleaning member, and an automated transport arm configured to (i) detachably couple the cleaning member, (ii) move the detachably-coupled cleaning member into a position proximate to and/or contacting the optical element, and (iii) decouple the cleaning member. |
申请公布号 |
WO2016164740(A1) |
申请公布日期 |
2016.10.13 |
申请号 |
WO2016US26669 |
申请日期 |
2016.04.08 |
申请人 |
GEN-PROBE INCORPORATED |
发明人 |
HAGEN, Norbert D.;KNIGHT, Byron J.;OPALSKY, David |
分类号 |
B08B11/00;B08B1/00;B08B9/00;G01N21/03;G01N21/15 |
主分类号 |
B08B11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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