发明名称 Phase contrast imaging apparatus
摘要 An x-ray imaging system includes an x-ray source, an x-ray detector including a plurality of detector strips arranged in a first direction of the x-ray detector. Each detector strip includes a plurality of detector pixels arranged in a second direction of the x-ray detector. A phase grating and a plurality of analyzer gratings including grating slits are disposed between the x-ray source and detectors. The x-ray source and the x-ray detector are adapted to perform a scanning movement in relation to an object in the first direction, in order to scan the object. Each of the plurality of analyzer gratings (162) is arranged in association with a respective detector strip with the grating slits arranged in the second direction. The grating slits of the analyzer gratings of the detector strips are offset relative to each other in the second direction.
申请公布号 US9486175(B2) 申请公布日期 2016.11.08
申请号 US201214126214 申请日期 2012.06.27
申请人 KONINKLIJKE PHILIPS N.V. 发明人 Fredenberg Erik;Aslund Magnus
分类号 A61B6/00;A61B6/06;A61B6/04 主分类号 A61B6/00
代理机构 代理人
主权项 1. An x-ray phase contrast imaging system comprising: a scan arm configured to move with respect to an imaging region; an x-ray source mounted to the scan arm; an x-ray detector mounted to the scan arm opposite the imaging region from the x-ray source, the x-ray detector including a plurality of detector strips arranged in a first direction of the x-ray detector, each detector strip further comprising a plurality of detector pixels arranged in a second direction of the x-ray detector; a phase grating disposed between the x-ray source and the x-ray detector; a plurality of analyzer gratings comprising grating slits, the analyzer gratings being mounted between the imaging region and the x-ray detector and configured to move with the x-ray detector; and; a controller configured to move the scan arm and the x-ray source and the x-ray detector in the first direction, in order to scan an object in the imaging region; wherein each of the plurality of analyzer gratings is arranged in association with a respective one of the detector strips with the grating slits arranged in the second direction; and wherein the grating slits of each analyzer grating offset in the second direction relative to the grating slits of other analyzer gratings.
地址 Eindhoven NL