| 摘要 |
Provided is a high-quality Ga2O3 semiconductor element. Provided is, as one embodiment of the present invention, a Ga2O3 MESFET (10), which includes: an n-type α-(AlxGa1-x)2O3 single crystal film (3), which is formed on an α-Al2O3 substrate (2) directly or with other layer therebetween, and is composed of an α-(AlxGa1-x)2O3 single crystal (0≦̸x≦̸1); a source electrode (12) and a drain electrode (13), which are formed on the n-type α-(AlxGa1-x)2O3 single crystal film (3); and a gate electrode (11), which is formed on a region between the source electrode (12) and the drain electrode (13) on the n-type α-(AlxGa1-x)2O3 single crystal film (3). |
