发明名称 CATALYST LAYER FORMATION INSPECTING DEVICE AND INSPECTION METHOD FOR THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a catalyst layer formation inspecting device and an inspection method for the same that can inspect the positional displacement amount of catalyst layers which confront each other through an electrolyte membrane.SOLUTION: A catalyst layer formation inspection device includes a lighting part 8 for lighting a first catalyst layer 2, a second catalyst layer 3 and an electrolyte membrane 1 at the peripheral edge portions thereof, a first imaging part 9, a second imaging part 10 and a third imaging part 11 that image light reflected at the first catalyst layer 2 and the second catalyst layer 3 and light totally-reflected at the electrolyte membrane 1 at the peripheral edge portions thereof, and an acquiring part for acquiring position information of the boundary lines of the catalyst layer peripheral edge portions acquired by the first imaging part 9, the second imaging part 10 and the third imaging part 11, thereby enabling inspection of the position displacement information of the catalyst layers which confront each other through the electrolyte membrane.SELECTED DRAWING: Figure 1
申请公布号 JP2016167381(A) 申请公布日期 2016.09.15
申请号 JP20150046352 申请日期 2015.03.09
申请人 PANASONIC IP MANAGEMENT CORP 发明人 IMAKURA SEIICHI;TANAKA HITOSHI
分类号 H01M4/86;G01N21/88;H01M4/88 主分类号 H01M4/86
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