发明名称 |
Method of forming a transistor and structure therefor |
摘要 |
In one embodiment, a semiconductor device is formed to include a gate structure extending into a semiconductor material that is underlying a first region of semiconductor material. The gate structure includes a conductor and also a gate insulator that has a first portion positioned between the gate conductor and a first portion of the semiconductor material that underlies the gate conductor. The first portion of the semiconductor material is configured to form a channel region of the transistor which underlies the gate conductor. The gate structure may also include a shield conductor overlying the gate conductor and having a shield insulator between the shield conductor and the gate conductor. The shield insulator may also have a second portion positioned between the shield conductor and a second portion of the gate insulator and a third portion overlying the shield conductor. |
申请公布号 |
US9466708(B2) |
申请公布日期 |
2016.10.11 |
申请号 |
US201313831883 |
申请日期 |
2013.03.15 |
申请人 |
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC |
发明人 |
Padmanabhan Balaji;Venkatraman Prasad;Grivna Gordon M. |
分类号 |
H01L21/02;H01L29/66;H01L21/70;H01L29/78;H01L29/40;H01L29/417;H01L29/423;H01L29/51 |
主分类号 |
H01L21/02 |
代理机构 |
|
代理人 |
Hightower Robert F. |
主权项 |
1. A transistor comprising:
a semiconductor substrate of a first conductivity type, the semiconductor substrate having a first surface and a second surface; a first semiconductor region having a second conductivity type on the first surface of the semiconductor substrate; a second semiconductor region formed within the first semiconductor region wherein a portion of the first semiconductor region underlies the second semiconductor region, the second semiconductor region having the first conductivity type; a gate structure formed in an opening that extends from the second semiconductor region into the first semiconductor region; a gate conductor of the gate structure formed within the opening and overlying a first portion of the first semiconductor region; a source region adjacent the gate conductor and spaced laterally from the gate conductor; a gate insulator between the gate conductor and the first portion of the first semiconductor region and between the source region and the gate conductor wherein a channel region of the transistor is in the first portion of the first semiconductor region so that current flows laterally between the source region and under the gate structure; a shield conductor overlying the gate conductor; and a shield insulator between the gate conductor and the shield conductor. |
地址 |
Phoenix AZ US |