发明名称 BI-AXIAL TENSILE STRAINED GE CHANNEL FOR CMOS
摘要 An apparatus comprising a complimentary metal oxide semiconductor (CMOS) inverter including an n-channel metal oxide semiconductor field effect transistor (MOSFET); and a p-channel MOSFET, wherein a material of a channel in the n-channel MOSFET and a material of a channel in the p-channel MOSFET is subject to a bi-axial tensile strain. A method including forming an n-channel metal oxide semiconductor field effect transistor (MOSFET); forming a p-channel MOSFET; and connecting the gate electrodes and the drain regions of the n-channel MOSFET and the p-channel MOSFET, wherein a material of the channel in the n-channel MOSFET and a material of the channel in the p-channel MOSFET is subject to a bi-axial tensile strain.
申请公布号 EP3087602(A1) 申请公布日期 2016.11.02
申请号 EP20130900530 申请日期 2013.12.27
申请人 INTEL CORPORATION 发明人 MAJHI, PRASHANT;MUKHERJEE, NILOY;PILLARISETTY, RAVI;RACHMADY, WILLY;CHAU, ROBERT, S.
分类号 H01L27/092;H01L21/8238;H01L29/78 主分类号 H01L27/092
代理机构 代理人
主权项
地址