Bitmap analysis system and method for high speed testing of a memory device

摘要

The invention provides a Bitmap analysis system or BMAS for high-speed testing a memory device (30). The system comprises:
a test engine (38) connected to the memory device (30) for generating bitmaps; and
a First-In First-Out, or FIFO block (31) having a write terminal connected to the test engine (38) and a read terminal connected to a tester (39);
wherein
the memory device (30) is partitioned into small equal sized memory segments;
the FIFO block (31) contains at least one FIFO segment equivalent to the size of said memory segments; and
the test engine (38) sequentially generates and verifies the bitmaps of each of the memory segment.