发明名称 APPEARANCE INSPECTION DEVICE AND APPEARANCE INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To obtain an appearance inspection device that can suppress inspection accuracy from falling due to a deviation of an inspection object.SOLUTION: An appearance inspection device 1 according to an embodiment comprises: a first imaging device 31 that sequentially photographs linear light L1 provided in an inspection object 100, formed in a first inspection object face 101 crossing a first direction and extending along a second direction crossing the second direction, in which an irradiation position in the inspection object face 101 moves along a third direction crossing the first direction and the second direction; an image data generation unit that generates first image data representing a three-dimensional shape of the inspection object face 101, using imaging data on the light L1 photographed by the first imaging device 31; a deviation-amount data acquisition unit that acquires first deviation-amount data representing an amount of deviation of the inspection object 100 with respect to a reference; and a correction unit that corrects the first image data using the first deviation-amount data.SELECTED DRAWING: Figure 1
申请公布号 JP2016090369(A) 申请公布日期 2016.05.23
申请号 JP20140224727 申请日期 2014.11.04
申请人 RICOH ELEMEX CORP;YOKOHAMA RUBBER CO LTD:THE 发明人 NAKAGAWA KEIJI
分类号 G01N21/952;G01B11/24 主分类号 G01N21/952
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